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Support - JEOL Korea ÀÚ·á½Ç
Support - JEOL Korea ÀÚ·á½Ç
total : 36
ÇöÀç ÆäÀÌÁö 1 / 2
36
[Microanalysis System] JEOL EDS SDD DETECTOR
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23.10.11
121
35
[Microanalysis System] JEOL EDS SDD CONTROLLER
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23.10.11
121
34
[Microanalysis System] JEOL EDS PREAMP CABLE
ÃÖÁöÇý
23.10.11
113
33
[Electron Microscope] JEOL EDS peltier cable
ÃÖÁöÇý
23.10.11
114
32
[Microanalysis System] JEOL EDS FLANGE
ÃÖÁöÇý
23.10.11
117
31
[Microanalysis System] JEOL EDS DPP
ÃÖÁöÇý
23.10.11
108
30
[Electron Microscope] PN 804500070 FILAMENT (K-TYPE)
°½½¿¬
23.08.31
144
29
[Electron Microscope] AT APERTURE SEL
ÀÌ¿ÁÁÖ
22.04.25
593
28
[Electron Microscope] GASKET PN 408007923
°½½¿¬
22.02.21
573
27
[Electron Microscope] ½ÅÇü SPEC EXCH ROD(W/CABLE) ÀÚ·á
°½½¿¬
21.11.29
791
26
[Electron Microscope] ION SOURCE(8KV) (PN 814758754)
°½½¿¬
21.10.27
687
25
[Electron Microscope] PLATE (PN 821148061)
°½½¿¬
21.10.27
660
24
[Electron Microscope] ÁÖ»çÀüÀÚÇö¹Ì°æ HV CABLE PN 780190980
°½½¿¬
21.05.18
1,138
23
[Electron Microscope] 814839606¡¡OBJECTIVE LENS
ÀÌ¿ÁÁÖ
20.12.21
1,146
22
[Electron Microscope] P/N 814702970 SCREEN DRIVE »çÁø
ÀÌ¿ÁÁÖ
20.03.13
1,426
21
[Electron Microscope] STEM BF APERTURE SEL
ÀÌ¿ÁÁÖ
20.03.02
1,384
20
[Electron Microscope] SA APERTURE SEL
ÀÌ¿ÁÁÖ
20.03.02
1,403
19
[Other Instruments] HP ELITEDESK 800 G1 TWR
ÀÌ¿ÁÁÖ
20.02.13
1,475
18
[Electron Microscope] P/N 810779765 HOLDER Á¤º¸
ÀÌ¿ÁÁÖ
19.08.29
1,520
17
[Electron Microscope] JCM-7000 Ãâ½Ã
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19.04.04
1,845
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