ID
PW
ȸ¿ø°¡ÀÔ
ºñ¹Ð¹øÈ£Ã£±â
HOME
Products
¢º Electron Microscope
¢º TEM
¢º SEM
¢º EPMA
¢º Multi Beam
¢º Sample prep.
¢º Analysis Instruments
¢º NMR
¢º ESR
¢º MASS
¢º Industrial Equipment
¢º Electron Beam Lithography
¢º Thin Film Formation Equipment
¢º Material Processing Equipment
¢º 3D Printer
¢º Microanalysis Systems
¢º EDS
¢º EBSD
¢º WDS
¢º Nanomanipulation
¢º Other Instruments
¢º Cressionton
¢º Gatan
¢º SPI
¢º NPGS
¢º Deben
Applications
¢º Aerospace Automobile
¢º Agriculture Food
¢º Biotechnology
¢º Chemicals
¢º Medical
¢º Metals Mining
¢º Energy
¢º Thin Films Coatings
¢º Phamaceuticals
¢º Polymers Fibers
¢º Semiconductors Electronics
¢º Material
¢º Enviroment
¢º Forensic
Support
¢º Á¦Ç°°ü·Ã ¹®ÀÇ (°ßÀû/»ç¾ç)
¢º ±â¼úÆ÷·³ Q&A
¢º JEOL Korea ÀÚ·á½Ç
¢º Service °ü·Ã ¹®ÀÇ
¢º Àåºñ¿¬°£ º¸¼ö¿ë¿ª °è¾à
¢º Image Gallery
¢º Service Report
¢º ÀÚÀ¯°Ô½ÃÆÇ
About us
¢º JEOL Korea News
¢º ȸ»ç¼Ò°³
¢º ¿À½Ã´Â ±æ
¢º JEOL Korea Recruit
¢º JEOL Korea °ü·Ã Site
Home
Support - ±â¼úÆ÷·³ Q&A
Support - ±â¼úÆ÷·³ Q&A
total : 740
ÇöÀç ÆäÀÌÁö 6 / 37
640
[Electron Microscope] ÀüÀÚÇö¹Ì°æ ±³À°ÀÏÁ¤¹®ÀÇ
ÇѰ漮
17.02.27
27
639
[Electron Microscope] SEM±³À°°ü·Ã Àç¹®ÀÇ ÀÔ´Ï´Ù.
(1)
°ûÇöÁ¤
17.01.20
113
638
[Electron Microscope] 2017³âµµ SEM ±³À°ÀÏÁ¤ ¹®ÀÇ
À¯Áø»ó
17.01.19
122
637
[Electron Microscope] 2017³âµµ SEM ±³À°ÀÏÁ¤ ¹®ÀÇ
ÇѰ漮
17.01.20
107
636
[Electron Microscope] SEM±³À°ÀÏÁ¤ ¹®ÀÇ
°ûÇöÁ¤
17.01.19
35
635
[Electron Microscope] SEM±³À°ÀÏÁ¤ ¹®ÀÇ
ÇѰ漮
17.01.20
15
634
[Electron Microscope] 17³âµµ SEM »ç¿ëÀÚ ±³À°ÀÏÁ¤ ¹®ÀÇ
±èÅÂÇü
17.01.09
100
633
[Electron Microscope] 17³âµµ SEM »ç¿ëÀÚ ±³À°ÀÏÁ¤ ¹®ÀÇ
ÇѰ漮
17.01.20
7
632
[Electron Microscope] SEM ±³À°ÀÏÁ¤ ¹®ÀÇ.
±è°æÈ¯
16.11.21
258
631
[Electron Microscope] SEM ±³À°ÀÏÁ¤ ¹®ÀÇ.
(1)
ÇѰ漮
16.11.23
338
630
[Microanalysis System] EPMA Á¤·®ºÐ¼® °ü·ÃÀÔ´Ï´Ù.
À¯¿äÇÑ
16.11.15
252
629
[Electron Microscope] eds ¾×üÁú¼Ò °ü·Ã ¹®ÀÇÀÔ´Ï´Ù
¿ì¼ö¿ë
16.11.01
277
628
[Electron Microscope] eds ¾×üÁú¼Ò °ü·Ã ¹®ÀÇÀÔ´Ï´Ù
¾ç°æÈ
16.11.02
523
627
[Electron Microscope] ±³À°¹®ÀÇ
½ÅÀç°æ
16.09.23
413
626
[Electron Microscope] ±³À°¹®ÀÇ
À̽ÂÀç
16.08.30
342
625
[Electron Microscope] ±³À°¹®ÀÇ
ÇѰ漮
16.08.30
426
624
[Electron Microscope] ±³À°¹®ÀÇ
Á¶ÈñÀ±
16.08.11
416
623
[Electron Microscope] ±³À°¹®ÀÇ
ÇѰ漮
16.08.16
351
622
[Microanalysis System] x-ray mapping µµÁß ¿¡·¯ ¹ß»ý
¹Úâ±Ù
16.08.01
1,263
621
[Electron Microscope] Cressington 108 sputter ¹®ÀÇ
±èÁÖ¼º
16.07.23
264
Á¦¸ñ
³»¿ë
ÀÛ¼ºÀÚ
<<
[1]
[2]
[3]
[4]
[5]
6
[7]
[8]
[9]
[10]
>>