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    626 [Electron Microscope] ±³À°¹®ÀÇ À̽ÂÀç 16.08.30 397
    625   [Electron Microscope] ±³À°¹®ÀÇ ÇѰ漮 16.08.30 486
    624 [Electron Microscope] ±³À°¹®ÀÇ Á¶ÈñÀ± 16.08.11 477
    623   [Electron Microscope] ±³À°¹®ÀÇ ÇѰ漮 16.08.16 406
    622 [Microanalysis System] x-ray mapping µµÁß ¿¡·¯ ¹ß»ý ¹Úâ±Ù 16.08.01 1,354
    621 [Electron Microscope] Cressington 108 sputter ¹®ÀÇ ±èÁÖ¼º 16.07.23 270
    620 [Electron Microscope] FE-SEM ±³À°¹®ÀÇ ¹Úµ¿±Ô 16.07.21 178
    619   [Electron Microscope] FE-SEM ±³À°¹®ÀÇ ÇѰ漮 16.07.22 300
    618 [Analysis Instruments] EDS ¹®ÀÇ ¿À¼º±Ô 16.07.07 130
    617   [Analysis Instruments] EDS ¹®ÀÇ ¾ç°æÈ­ 16.07.07 774
    616 [Electron Microscope] EDS ºÐ¼® °á°ú C °ËÃ⠱輺Çå 16.06.20 129
    615   [Electron Microscope] EDS ºÐ¼® °á°ú C °ËÃâ ¾ç°æÈ­ 16.06.21 1,542
    614 [Electron Microscope] JEOL JSM-7500F ¸Å´º¾ó ¿äû (1) ±èÅÂÇö 16.06.16 113
    613 [Electron Microscope] sem ±³À°¹®ÀÇ (2) À̹®¶ô 16.06.15 118
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    611 [Electron Microscope] ±³À°¹®ÀÇ ¹Ú»ó¹Ì 16.04.25 129
    610   [Electron Microscope] ±³À°¹®ÀÇ ÇѰ漮 16.04.25 83
    609 [Electron Microscope] FE-SEM ±³À° °ü·ÃÇØ¼­ ¹®ÀÇ µå¸³´Ï´Ù. Àº¿µ¹« 16.04.01 114
    608   [Electron Microscope] FE-SEM ±³À° °ü·ÃÇØ¼­ ¹®ÀÇ µå¸³´Ï´Ù. ÇѰ漮 16.04.01 157
    607 [Electron Microscope] sem ±³À° ¹®ÀÇ µå¸³´Ï´Ù ±èÈÆ 16.03.30 85
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