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    600   [Electron Microscope] EDS ºÐ¼® °á°ú½Ã ź¼Ò °ËÃâ ¾ç°æÈ­ 16.02.12 1,858
    599 [Electron Microscope] FE SEM ±³À° ¹®ÀÇ. ±èµ¿À± 16.02.04 18
    598   [Electron Microscope] FE SEM ±³À° ¹®ÀÇ. (1) ÇѰ漮 16.02.04 32
    597 [Electron Microscope] 2016³âµµ SEM/CP ±³À° ÀÏÁ¤ °øÁö ÇѰ漮 16.02.02 10
    596 [Electron Microscope] 16³âµµ »ç¿ëÀÚ ¼¼¹Ì³ª ÀÏÁ¤ ¹®ÀÇ ±è¾Æ¸§ 16.01.22 7
    595   [Electron Microscope] 16³âµµ »ç¿ëÀÚ ¼¼¹Ì³ª ÀÏÁ¤ ¹®ÀÇ ÇѰ漮 16.01.22 28
    594 [Electron Microscope] 2016³âµµ SEM ¹× EDS ±³À° ÀÏÁ¤ ¹®Àǵ帳´Ï´Ù. °íÅ»ó 16.01.08 11
    593   [Electron Microscope] 2016³âµµ SEM ¹× EDS ±³À° ÀÏÁ¤ ¹®Àǵ帳´Ï´Ù. (1) ÇѰ漮 16.01.11 44
    592   [Electron Microscope] 2016³âµµ SEM ¹× EDS ±³À° ÀÏÁ¤ ¹®Àǵ帳´Ï´Ù. ÇѰ漮 16.01.22 8
    591 [Electron Microscope] À̿ºöÀý´Ü±â ¹®ÀÇ À±¼®¿ø 16.01.08 35
    590 [Electron Microscope] JSM-5600 ¹®ÀÇ ¿À¼º±Ô 16.01.05 3
    589   [Electron Microscope] JSM-5600 ¹®ÀÇ ÃÖ´öȯ 16.01.05 6
    588 [Electron Microscope] EDS °ü·Ã ¹®ÀÇ ¹ÚÁ¤ÀÓ 15.10.22 62
    587   [Electron Microscope] EDS °ü·Ã ¹®ÀÇ ¾ç°æÈ­ 15.10.22 136
    586 [Microanalysis System] X-ray mapping °á°ú export °ü·Ã °ÇÀÇ ¹Úâ±Ù 15.08.25 42
    585 [Microanalysis System] Àå½Ã°£ X-ray ¸ÊÇÎ ¹®Á¦: JXA-8530F (2) ¹Úâ±Ù 15.08.04 67
    584 [Microanalysis System] Offline correction¹®Á¦:JXA-8530F (2) ¹Úâ±Ù 15.07.29 62
    583 [Electron Microscope] Ç¥¸é ¹Ì¼¼¿À¿°¿¡ ´ëÇÑ ÇØ¼® ½Å¾È¼· 15.07.10 38
    582   [Electron Microscope] Ç¥¸é ¹Ì¼¼¿À¿°¿¡ ´ëÇÑ ÇØ¼® ¾ç°æÈ­ 15.07.13 134
    581 [Other Instruments] CP °¡°øÁ¶°Ç °ü·Ã ¹®ÀÇ (1) ¹ÚÀçÇö 15.07.10 39
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