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  • JEOL/Oxford ·±Ãµ¼¼¹Ì³ª ¾È³»(IUMAS-V)
    ¿µ¾÷º»ºÎ 2011.05.12


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    ¾Æ·¡¿Í °°ÀÌ JEOL»ç ¹× Oxford»ç¿¡¼­ ·±Ãµ¼¼¹Ì³ª¸¦ ÁغñÇÏ¿´»ç¿À´Ï ¸¹Àº °ü½É°ú Âü¿© ¹Ù¶ø´Ï´Ù.

     

    5¿ù23ÀÏ(¿ù) 12:40 ~ 13:20 (2F ·±´ø·ë)

    Oxford Instruments NanoAnalysis / Dr. Christian Lang

    Topic : Advances in Materials Characterisation

     

    5¿ù24ÀÏ(È­) 12:30 ~ 13:10 (2F ¼­¿ï·ë)

    1) JEOL Ltd. / Kazumichi Ogura

    Topic : Advances in FE-SEM for Nano-& Micro-scale Imaging and Analysis

    2) JEOL Ltd. / Eiji Okunishi

    Topic : The introduction of newly developed High Solid Angle SDD detector and its application for TEM

     

     

     


     
      [ ´ÙÀ½±Û ] NMR Workshop ¾È³»
      [ ÇöÀç±Û ] JEOL/Oxford ·±Ãµ¼¼¹Ì³ª ¾È³»(IUMAS-V)
      [ ÀÌÀü±Û ] 2011³âµµ EDS Training School¾È³»