JEOL Korea News
5¿ù22ÀÏ(ÀÏ)ºÎÅÍ 5¿ù27ÀÏ(±Ý)±îÁö ¿Ã¸²ÇÈÆÄÅ©ÅÚ¿¡¼ ÁøÇàµÇ´Â IUMAS-V ±¹Á¦ÇмúÇà»ç ÇÁ·Î±×·¥ Áß¿¡ ¾Æ·¡¿Í °°ÀÌ JEOL»ç ¹× Oxford»ç¿¡¼ ·±Ãµ¼¼¹Ì³ª¸¦ ÁغñÇÏ¿´»ç¿À´Ï ¸¹Àº °ü½É°ú Âü¿© ¹Ù¶ø´Ï´Ù.
5¿ù23ÀÏ(¿ù) 12:40 ~ 13:20 (2F ·±´ø·ë) Oxford Instruments NanoAnalysis / Dr. Christian Lang Topic : Advances in Materials Characterisation
5¿ù24ÀÏ(È) 12:30 ~ 13:10 (2F ¼¿ï·ë) 1) JEOL Ltd. / Kazumichi Ogura Topic : Advances in FE-SEM for Nano-& Micro-scale Imaging and Analysis 2) JEOL Ltd. / Eiji Okunishi Topic : The introduction of newly developed High Solid Angle SDD detector and its application for TEM
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[ ´ÙÀ½±Û ] NMR Workshop ¾È³» [ ÇöÀç±Û ] JEOL/Oxford ·±Ãµ¼¼¹Ì³ª ¾È³»(IUMAS-V) [ ÀÌÀü±Û ] 2011³âµµ EDS Training School¾È³» |